2010, Vol. 27(7): 74206-074206    DOI: 10.1088/0256-307X/27/7/074206
A Novel Micro-Displacement Measuring Method Based on Optical Path Modulation

QU Wei1,2, YE Hong-An1,2
1The Key Lab of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080 2College of Electronic Engineering, Heilongjiang University, Harbin 150080
收稿日期 2010-04-28  修回日期 1900-01-01
Supporting info

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