Double-Exponentially Decayed Photoionization in CREI Effect: Numerical Experiment on 3D H2+
LI Feng1,2, WANG Ting-Ying1,2, ZHANG Gui-Zhong1,2, XIANG Wang-Hua1,2, W. T. Hill III3
1College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 3000722Key Lab of Optoelectronic Information and Technical Science (Ministry of Education), Tianjin University, Tianjin 3000723Institute for Physical Science and Technology, University of Maryland at College Park, MD20742, USA
Double-Exponentially Decayed Photoionization in CREI Effect: Numerical Experiment on 3D H2+
LI Feng1,2;WANG Ting-Ying1,2;ZHANG Gui-Zhong1,2;XIANG Wang-Hua1,2;W. T. Hill III3
1College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 3000722Key Lab of Optoelectronic Information and Technical Science (Ministry of Education), Tianjin University, Tianjin 3000723Institute for Physical Science and Technology, University of Maryland at College Park, MD20742, USA
摘要On the platform of the 3D H2+ system, we perform a numerical simulation of its photoionization rate under excitation of weak to intense laser intensities with varying pulse durations and wavelengths. A novel method is proposed for calculating the photoionization rate: a double exponential decay of ionization probability is best suited for fitting this rate. Confirmation of the well-documented charge-resonance-enhanced ionization (CREI) effect at medium laser intensity and finding of ionization saturation at high light intensity corroborate the robustness of the suggested double-exponential decay process. Surveying the spatial and temporal variations of electron wavefunctions uncovers a mechanism for the double-exponentially decayed photoionization probability as onset of electron ionization along extra degree of freedom. Henceforth, the new method makes clear the origins of peak features in photoionization rate versus internuclear separation. It is believed that this multi-exponentially decayed ionization mechanism is applicable to systems with more degrees of motion.
Abstract：On the platform of the 3D H2+ system, we perform a numerical simulation of its photoionization rate under excitation of weak to intense laser intensities with varying pulse durations and wavelengths. A novel method is proposed for calculating the photoionization rate: a double exponential decay of ionization probability is best suited for fitting this rate. Confirmation of the well-documented charge-resonance-enhanced ionization (CREI) effect at medium laser intensity and finding of ionization saturation at high light intensity corroborate the robustness of the suggested double-exponential decay process. Surveying the spatial and temporal variations of electron wavefunctions uncovers a mechanism for the double-exponentially decayed photoionization probability as onset of electron ionization along extra degree of freedom. Henceforth, the new method makes clear the origins of peak features in photoionization rate versus internuclear separation. It is believed that this multi-exponentially decayed ionization mechanism is applicable to systems with more degrees of motion.
(Multiphoton ionization and excitation to highly excited states)
引用本文:
LI Feng;WANG Ting-Ying;ZHANG Gui-Zhong;XIANG Wang-Hua;W. T. Hill III. Double-Exponentially Decayed Photoionization in CREI Effect: Numerical Experiment on 3D H2+[J]. 中国物理快报, 2008, 25(2): 465-467.
LI Feng, WANG Ting-Ying, ZHANG Gui-Zhong, XIANG Wang-Hua, W. T. Hill III. Double-Exponentially Decayed Photoionization in CREI Effect: Numerical Experiment on 3D H2+. Chin. Phys. Lett., 2008, 25(2): 465-467.
[1] Zuo T and Bandrauk A D 1995 Phys. Rev. A 52 R2511 [2] Seideman T, Ivanov M Y and Corkum P B 1995 Phys. Rev.Lett. 75 2819 [3] Kjeldsen T K, Madsen L B and Hansen J P 2006 Phys. Rev. A 74 035402 [4] Selst\o S, Forre M, Hansen J P and Madsen L B 2005 Phys. Rev.Lett. 95 093002 [5] Wang B et al 2004 Chin. Phys. Lett. 21 1727 [6] Zhang Z, Zhang G Z, Xiang W H and Hill III W T 2006 Chin.Phys. Lett. 23 1445 [7] Gibson G L, Li M, Guo C and Neira J 1997 Phys. Rev. Lett. 79 2022 [8] Baier S, Ruiz C, Plaja L and Becker A 2006 Phys. Rev. A 74 033405
2008, Vol. 25 
