2011, Vol. 28(9): 97803-097803    DOI: 10.1088/0256-307X/28/9/097803
	Measurement of the Optical Constants of Thin Metal Films by THz Differential Time Domain Spectroscopy
	MA Feng-Ying, SU Jian-Po**, GONG Qiao-Xia, YANG Jing, DU Yan-Li, GUO Mao-Tian, YUAN Bin
	School of Physical Science and Engineering, Zhengzhou University, Zhengzhou 450001
	收稿日期 2011-02-17  修回日期 1900-01-01
	Supporting info
	[1] Palka N 2010 Acta Phys. Pol. A 118 1229 [2] Zhang L L et al 2008 Appl. Phys. Lett. 92 091117 [3] Rutz F and Koch M 2006 Int. J. Infrared Millimeter Waves 27 547 [4] Grossman E et al 2010 Appl. Opt. 49 E106 [5] Federici J and Moeller L 2010 J. Appl. Phys. 107 111101 [6] Gatesman A J et al 1995 J. Opt. Soc. Am. B 12 212 [7] Ying L Y et al 2008 Jpn. J. Appl. Phys. 47 7926 [8] Oulachgar H et al 2010 The 35th International Conference on Infrared, Millimeter, and Terahertz Waves (Rome, 5–10 September 2010) paper 5612408 [9] Kröll J et al 2007 Opt. Express 15 6552 [10] Zhou D X et al 2008 J. Appl. Phys. 104 053110 [11] Yasuda H and Hosako I 2008 Jpn. J. Appl. Phys. 47 1632 [12] Samuel P M et al 2002 Microelectron. J. 33 1033 [13] Jiang Z P et al 2000 Appl. Phys. Lett. 76 3221 [14] Liu H B et al 2007 Biosens. Bioelectron. 22 1075 [15] Menikh A et al 2002 Chem. Phys. Chem. 3 655 [16] Ma F Y and Liu X Y 2007 Appl. Opt. 46 6247 [17] Hu Y et al 2006 Phys. Lett. A 359 728