摘要Three kinds of nanometer-scale metal films (Cr, Ni and Ti) with different thicknesses are fabricated. The complex refractive indices of the three metal films are quantitatively measured by using THz differential time-domain spectroscopy (THz-DTDS). The orders of the complex refractive indices of the thin metal films are equal to those of the reported values. Our results validated that THz-DTDS can be used to study the features of the ultra-thin metal films.
Abstract：Three kinds of nanometer-scale metal films (Cr, Ni and Ti) with different thicknesses are fabricated. The complex refractive indices of the three metal films are quantitatively measured by using THz differential time-domain spectroscopy (THz-DTDS). The orders of the complex refractive indices of the thin metal films are equal to those of the reported values. Our results validated that THz-DTDS can be used to study the features of the ultra-thin metal films.
(Submillimeter wave, microwave and radiowave spectrometers; magnetic resonance spectrometers, auxiliary equipment, and techniques)
引用本文:
MA Feng-Ying;SU Jian-Po**;GONG Qiao-Xia;YANG Jing;DU Yan-Li;GUO Mao-Tian;YUAN Bin
. Measurement of the Optical Constants of Thin Metal Films by THz Differential Time Domain Spectroscopy[J]. 中国物理快报, 2011, 28(9): 97803-097803.
MA Feng-Ying, SU Jian-Po**, GONG Qiao-Xia, YANG Jing, DU Yan-Li, GUO Mao-Tian, YUAN Bin
. Measurement of the Optical Constants of Thin Metal Films by THz Differential Time Domain Spectroscopy. Chin. Phys. Lett., 2011, 28(9): 97803-097803.
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