2011, Vol. 28(2): 24206-024206    DOI: 10.1088/0256-307X/28/2/024206
	Measurement of Random Surface Parameters by Angle-Resolved In-plane Light Scattering with Constant Perpendicular Wave Vector
	LI Hai-Xia1,2, LIU Chun-Xiang1, CHEN Xiao-Yi1, ZHANG Mei-Na1, CHENG Chuan-Fu1**
	1College of Physics and Electronics, Shandong Normal University, Jinan 250014 2Department of Information Science and Technology, Shandong University of Politics Science and Law, Jinan 250014
	收稿日期 2010-07-12  修回日期 1900-01-01
	Supporting info
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