2008, Vol. 25(10): 3597-3600 DOI: | ||
Characterization Method of Polycrystalline Materials Using Conductive Atomic Force Microscopy | ||
DING Xi-Dong1, FU Gang2, XIONG Xiao-Min1, ZHANG Jin-Xiu1 | ||
1State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 5102752Department of Physics, Guangzhou University, Guangzhou 510405 | ||
收稿日期 2008-04-12 修回日期 1900-01-01 | ||
Supporting info | ||
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