中国物理快报  2016, Vol. 33 Issue (05): 57201-057201    DOI: 10.1088/0256-307X/33/5/057201
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Investigations for the Surface of the Oxide Semiconductor Changes by Reduction
Bonghoon Kang1**, Sung-Tae Hwang2
1Department of Visual Optics, Far East University, Chungcheongbuk-do, Korea
2College of Engineering, Hansung University, Seoul, Korea