Influence of Ring Oxidation-Induced Stack Faults on Efficiency in Silicon Solar Cells
ZHOU Chun-Lan, WANG Wen-Jing, LI Hai-Ling, ZHAO Lei, DIAO Hong-Wei, LI-Xu-Dong
Solar Cell Technology Laboratory, Institute of Electrical Engineering, Chinese Academy of Sciences, PO Box 2703, Beijing 100080 ***Beijing Solar Energy Research Institute, Beijing, 100083
Influence of Ring Oxidation-Induced Stack Faults on Efficiency in Silicon Solar Cells
ZHOU Chun-Lan, WANG Wen-Jing, LI Hai-Ling, ZHAO Lei, DIAO Hong-Wei, LI-Xu-Dong
Solar Cell Technology Laboratory, Institute of Electrical Engineering, Chinese Academy of Sciences, PO Box 2703, Beijing 100080 ***Beijing Solar Energy Research Institute, Beijing, 100083
摘要We observe a strong correlation between the ring oxidation-induced stack faults (OISF) formed in the course of phosphor diffusion and the efficiency of Czochralski-grown silicon solar cells. The main reason for ring-OISF formation and growth in substrate is the silicon oxidation and phosphorus diffusion process induced silicon self-interstitial point defect during POCl3 diffusion. The decreasing of minority carrier diffusion length in crystal silicon solar cell induced by ring-OISF defects is identified to be one of the major causes of efficiency loss.
Abstract：We observe a strong correlation between the ring oxidation-induced stack faults (OISF) formed in the course of phosphor diffusion and the efficiency of Czochralski-grown silicon solar cells. The main reason for ring-OISF formation and growth in substrate is the silicon oxidation and phosphorus diffusion process induced silicon self-interstitial point defect during POCl3 diffusion. The decreasing of minority carrier diffusion length in crystal silicon solar cell induced by ring-OISF defects is identified to be one of the major causes of efficiency loss.
(Stacking faults and other planar or extended defects)
引用本文:
ZHOU Chun-Lan;WANG Wen-Jing;LI Hai-Ling;ZHAO Lei;DIAO Hong-Wei;LI-Xu-Dong. Influence of Ring Oxidation-Induced Stack Faults on Efficiency in Silicon Solar Cells[J]. 中国物理快报, 2008, 25(8): 3005-3008.
ZHOU Chun-Lan, WANG Wen-Jing, LI Hai-Ling, ZHAO Lei, DIAO Hong-Wei, LI-Xu-Dong. Influence of Ring Oxidation-Induced Stack Faults on Efficiency in Silicon Solar Cells. Chin. Phys. Lett., 2008, 25(8): 3005-3008.
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2008, Vol. 25 
