2008, Vol. 25(8): 3005-3008 DOI: | ||
Influence of Ring Oxidation-Induced Stack Faults on Efficiency in Silicon Solar Cells | ||
ZHOU Chun-Lan, WANG Wen-Jing, LI Hai-Ling, ZHAO Lei, DIAO Hong-Wei, LI-Xu-Dong | ||
Solar Cell Technology Laboratory, Institute of Electrical Engineering, Chinese Academy of Sciences, PO Box 2703, Beijing 100080 ***Beijing Solar Energy Research Institute, Beijing, 100083 | ||
收稿日期 2008-03-10 修回日期 1900-01-01 | ||
Supporting info | ||
[1] Dieter K S 1998 Semiconductor Material and Device [2] William S and Read J W T 1952 Phys. Rev. 87 [3] Hall R N 1952 Phys. Rev. 87 387 [4] Higgs V and Kittler M 1993 Appl. Phys. Lett. [5] Singh D P et al 1996 J. Electron. Mater. 25 [6] Fischer H et al 1973 Proc. the 10th IEEE Photovoltaic [7] Aberle A G et al 1997 Proc. the IEEE 26th [8] Schmidt J 2004 Solid State Phenom. 95-96 187 [9] Haddad H et al 1992 Proceed. the 1992 International [10] Garth K S et al Semiconductor Manufacturing [11] Sinno T et al 2000 Mater. Sci. Engin. Rep. R [12] Sadamitsu S et al 1995 Jpn. J. Appl. Phys. 34 [13] Voronkov V V and Falster R 1999 J. Cryst. Growth [14] Schmidt J and Aberle A G 1997 J. Appl. Phys. [15] Marek J 1984 J. Appl. Phys. 55 318 [16] Hao Q Y, Liu C C and Zhang J F 2006 Rare Metals [17] Ravi K V and Varker C J 1974 J. Appl. Phys. [18] Nishi K and Antoniadis D A 1986 J. Appl. Phys [19] Froitzheim A et al 2003 Proc. 3rd World Conference |
||