摘要A method for simultaneously extracting the parameters of self-affine fractal surfaces from a single experimental profile of scattered intensity data is proposed. The Levenberg-Marquardt algorithm is introduced to fit the theoretical equation for the scattering intensity profile to the experimental data. A precision system is designed for acquisition of scattering intensity data using the Boxcar integration technique. The surface parameters extracted (root-mean-square roughness w, lateral correlation length ξ, and roughness exponent α) are compared to those obtained using atomic force microscopy.
Abstract：A method for simultaneously extracting the parameters of self-affine fractal surfaces from a single experimental profile of scattered intensity data is proposed. The Levenberg-Marquardt algorithm is introduced to fit the theoretical equation for the scattering intensity profile to the experimental data. A precision system is designed for acquisition of scattering intensity data using the Boxcar integration technique. The surface parameters extracted (root-mean-square roughness w, lateral correlation length ξ, and roughness exponent α) are compared to those obtained using atomic force microscopy.
ZHANG Ning-Yu;TENG Shu-Yun;SONG Hong-Sheng;LIU Gui-Yuan;CHENG Chuan-Fu. Extraction of Parameters of Random Self-Affine Fractal Surfaces from Light Scattered Intensity by Levenberg-Marquardt Algorithm[J]. 中国物理快报, 2009, 26(3): 34209-034209.
ZHANG Ning-Yu, TENG Shu-Yun, SONG Hong-Sheng, LIU Gui-Yuan, CHENG Chuan-Fu. Extraction of Parameters of Random Self-Affine Fractal Surfaces from Light Scattered Intensity by Levenberg-Marquardt Algorithm. Chin. Phys. Lett., 2009, 26(3): 34209-034209.
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2009, Vol. 26 
