Atomistic Simulation of He Clustering and Defects Produced in Ni
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Abstract
Using the molecular dynamics method, the stability of small He-vacancy clusters is studied under the condition of the high He and low vacancy densities. The result shows that there is a competition between He atoms detrapped and self-interstitial atoms (SIAs) emitted during the clustering of He atoms. When the He number is above a critical value of 9, the SIA emission is predominant. The SIA emission can result in deep capture of He atoms since the binding energy of He to a He-vacancy cluster is increased with the number of SIAs created. The cluster thus grows up. In addition, more SIAs are created when the temperature is elevated. The average volume of a He atom is increased. The cluster expansion takes place at high temperature.
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LIU Ti-Jiang, WANG Yue-Xia, PAN Zheng-Ying, JIANG Xiao-Mei, ZHOU-Liang, ZHU Jing. Atomistic Simulation of He Clustering and Defects Produced in Ni[J]. Chin. Phys. Lett., 2006, 23(5): 1261-1264.
LIU Ti-Jiang, WANG Yue-Xia, PAN Zheng-Ying, JIANG Xiao-Mei, ZHOU-Liang, ZHU Jing. Atomistic Simulation of He Clustering and Defects Produced in Ni[J]. Chin. Phys. Lett., 2006, 23(5): 1261-1264.
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LIU Ti-Jiang, WANG Yue-Xia, PAN Zheng-Ying, JIANG Xiao-Mei, ZHOU-Liang, ZHU Jing. Atomistic Simulation of He Clustering and Defects Produced in Ni[J]. Chin. Phys. Lett., 2006, 23(5): 1261-1264.
LIU Ti-Jiang, WANG Yue-Xia, PAN Zheng-Ying, JIANG Xiao-Mei, ZHOU-Liang, ZHU Jing. Atomistic Simulation of He Clustering and Defects Produced in Ni[J]. Chin. Phys. Lett., 2006, 23(5): 1261-1264.
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