Inductance of Long Intrinsic Josephson Junction Arrays Composed of Misaligned Tl₂Ba₂CaCu₂O₈ Thin Films

We observe and measure the inductance of long intrinsic Josephson junction arrays composed of misaligned Tl₂Ba₂CaCu₂O₈ thin films grown on LaAlO₃ substrates. The array consists of about 9.1×10³ intrinsic Josephson junctions, where 90° phase shift between ac voltage across the array and ac current flowing through has been measured. Furthermore, the voltage is proportional to the frequency of the current. The measured inductance values of the intrinsic Josephson junction arrays are basically consistent with the theoretically calculated results, confirming that the inductance is mainly due to the Josephson effect. The dependence of the array inductance on its critical current is also discussed.