Photoacoustic Spectroscopy Measurement of C60 Thin Film
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Abstract
Photoacoustic spectroscopy of C60 thin film is presented. The optical band edge of solid C60 and the optical absorption coefficient at absorption edge are determined. A weak absorption shoulder at 1.70eV is observed. While the thickness of C60 thin film is less than 1μm, photoacoustic saturation at band edge is avoided.
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Cite this article:
GU Gang, ZANG Wencheng, ZENG Hao, CHEN Geng, DU Youwei, ZHENG Yibin, ZHANG Shuyi. Photoacoustic Spectroscopy Measurement of C60 Thin Film[J]. Chin. Phys. Lett., 1994, 11(2): 102-104.
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GU Gang, ZANG Wencheng, ZENG Hao, CHEN Geng, DU Youwei, ZHENG Yibin, ZHANG Shuyi. Photoacoustic Spectroscopy Measurement of C60 Thin Film[J]. Chin. Phys. Lett., 1994, 11(2): 102-104.
|
GU Gang, ZANG Wencheng, ZENG Hao, CHEN Geng, DU Youwei, ZHENG Yibin, ZHANG Shuyi. Photoacoustic Spectroscopy Measurement of C60 Thin Film[J]. Chin. Phys. Lett., 1994, 11(2): 102-104.
|
GU Gang, ZANG Wencheng, ZENG Hao, CHEN Geng, DU Youwei, ZHENG Yibin, ZHANG Shuyi. Photoacoustic Spectroscopy Measurement of C60 Thin Film[J]. Chin. Phys. Lett., 1994, 11(2): 102-104.
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