X-RAY DIFFRACTION OF Cu/Ti FIBONACCI SUPERLATTICES

1-D quasiperiodic (Fibonacci) Cu/Ti metallic superlattices have been prepared in a dual magnetron sputter deposition system. X-ray scattering measurements of these samples are presented. The X-ray diffraction peaks at low angles can be indexed by the projection method from the high-dimensional periodic structure. In the high angle region, there is one broad peak, which indicates that the samples are amorphous.