Crystal-Orientation Dependent Evolution of Edge Dislocations from a Void in Single Crystal Cu

  • The micro-void growth by dislocation emission under tensile loading is explored with focus on the influence of crystal orientations. Based on the elastic theory, a dislocation emission criterion is formulated. It is predicted that the preferential location of dislocation nucleation and its threshold stress are dependent on the crystal orientation. Large-scale molecular dynamics (MD) simulations are also performed for single crystal copper to illustrate the dislocation evolution pattern associated with a nano-void growth. The results are in line with those given by the theoretical prediction. As revealed by MD simulations, the characteristics of void growth at micro-scale depend greatly on the crystal-orientation.

  • Article Text

  • loading

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return