Growth Zone Boundary in a Self-Frequency Doubling Crystal of Nd³⁺-Doped YA1₃(BO₃)₄

One of the main defects in the self-frequency doubling crystal of Nd3+-doped YA1₃(BO₃)₄ (NYAB), which may be the key factor to influence the crystal performance, is the growth zone boundary that has been identified by means of x-ray diffraction topography. The characteristic boundary is formed usually by the basal plane and the pyramidal planes or by the pyramidal planes themselves.