Angular Dependence of Critical Current in Ag-Seathed Bi(2223)Superconductor Tape
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Abstract
The critical current Ic (B.T.θ) of Ag-sheathed Bi (2223) tape was measured at 4.2 and 77k in magnetic field up to 6T as a function of the field direction. The maximum Ic is observed when the flux line are along the CuO2 planes. This effect is due to an intrinsic pinning between CuO2 layers. When H > 0.5T at 4.2K, Ic decreases very slowly with the magnetic field. The results are consistent with our early-proposed scaling laws for flux pinning in Ag-sheathed tape.
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References
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