COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION
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Abstract
The microstructure of alpha brass deformed to various degree ε was examined with positron annihilation technique and X-ray profile analysis. Stretch stress δ, positron annihilation probabilities Γ1, effective subgrain size Deff, positron lifetime T1 , dislocation density ρ, positron lifetime T2 and T etc. were measured as functions of deformation degree ε . Combined analyses of these curves were performed and positron annihilation models of single vacancy, dislocation, vacancy group and microvoid were suggested.
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Cite this article:
TENG Feng en, LIU Baozhang, LI Yanqin. COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION[J]. Chin. Phys. Lett., 1990, 7(7): 312-315.
TENG Feng en, LIU Baozhang, LI Yanqin. COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION[J]. Chin. Phys. Lett., 1990, 7(7): 312-315.
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TENG Feng en, LIU Baozhang, LI Yanqin. COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION[J]. Chin. Phys. Lett., 1990, 7(7): 312-315.
TENG Feng en, LIU Baozhang, LI Yanqin. COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION[J]. Chin. Phys. Lett., 1990, 7(7): 312-315.
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