Scanning Tunnelling Microscope Tip-Induced Reconstruction onSi(111)√3 x√3 R30°-Ag Surface
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Abstract
The reconstruction process of the Si(111) √3 x√3 R30°-Ag surface is studied by using a scanning tunnelling microscope at 78K. By applying a strong interaction between the tip and the surface, a tip-induced reconstruction corresponding to the mergence of two Si(111) √3 x√3 R30°-Ag domains is observed. Based on the inequivalent trimers (IET) model, this reconstruction process is attributed to a transition between the clockwise and counterclockwise IET domains. With this transition, the honeycomb-chained-trimer Si(111) )√3 x√3 R30°-Ag anti-phase boundary disappears and changes to the IET structure.
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LI Bin, ZENG Chang-Gan, WANG Hai-Qian, WANG Bing, HOU Jian-Guo. Scanning Tunnelling Microscope Tip-Induced Reconstruction onSi(111)√3 x√3 R30°-Ag Surface[J]. Chin. Phys. Lett., 2001, 18(2): 181-183.
LI Bin, ZENG Chang-Gan, WANG Hai-Qian, WANG Bing, HOU Jian-Guo. Scanning Tunnelling Microscope Tip-Induced Reconstruction onSi(111)√3 x√3 R30°-Ag Surface[J]. Chin. Phys. Lett., 2001, 18(2): 181-183.
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LI Bin, ZENG Chang-Gan, WANG Hai-Qian, WANG Bing, HOU Jian-Guo. Scanning Tunnelling Microscope Tip-Induced Reconstruction onSi(111)√3 x√3 R30°-Ag Surface[J]. Chin. Phys. Lett., 2001, 18(2): 181-183.
LI Bin, ZENG Chang-Gan, WANG Hai-Qian, WANG Bing, HOU Jian-Guo. Scanning Tunnelling Microscope Tip-Induced Reconstruction onSi(111)√3 x√3 R30°-Ag Surface[J]. Chin. Phys. Lett., 2001, 18(2): 181-183.
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