Measurement and Multiple Scattering Correction of K-ShellIonization Cross Sections of Silver by Electron Impact
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Abstract
The K-Shell ionization cross sections of silver have been measured by electron impact. In order to overcome the difficulties in preparing a self-supporting thin target, a thin target with a thick substrate was used in our experiments. The influence of electrons reflected from the substrate was corrected by means of a detailed calculation of electron transport. The path of the electrons passing through silver target of 31.2μg/cm2 was calculated by the EGS4 Monte Carlo program. This method of correction for the measurement is reported for the first time.
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ZHOU Chang-Geng, FU Yu-Chuan, AN Zhu, TANG Chang-Huan, LUO Zheng-Ming. Measurement and Multiple Scattering Correction of K-ShellIonization Cross Sections of Silver by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(4): 531-532.
ZHOU Chang-Geng, FU Yu-Chuan, AN Zhu, TANG Chang-Huan, LUO Zheng-Ming. Measurement and Multiple Scattering Correction of K-ShellIonization Cross Sections of Silver by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(4): 531-532.
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ZHOU Chang-Geng, FU Yu-Chuan, AN Zhu, TANG Chang-Huan, LUO Zheng-Ming. Measurement and Multiple Scattering Correction of K-ShellIonization Cross Sections of Silver by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(4): 531-532.
ZHOU Chang-Geng, FU Yu-Chuan, AN Zhu, TANG Chang-Huan, LUO Zheng-Ming. Measurement and Multiple Scattering Correction of K-ShellIonization Cross Sections of Silver by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(4): 531-532.
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