Measurement and Correction of K-Shell Ionization Cross Sections for Copper and Gallium by Electron Impact
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Abstract
The K-Shell ionization cross sections of Cu and Ga are measured by electron impact and the data of Ga are reported for the first time. The method of a thin chemical compound target with a thick substrate is formally used in the experiment. The influence of electrons reflected from the substrate is corrected by means of a calculation of electron transport.
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ZHOU Chang-Geng, AN Zhu, LUO Zheng-Ming. Measurement and Correction of K-Shell Ionization Cross Sections for Copper and Gallium by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(6): 759-760.
ZHOU Chang-Geng, AN Zhu, LUO Zheng-Ming. Measurement and Correction of K-Shell Ionization Cross Sections for Copper and Gallium by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(6): 759-760.
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ZHOU Chang-Geng, AN Zhu, LUO Zheng-Ming. Measurement and Correction of K-Shell Ionization Cross Sections for Copper and Gallium by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(6): 759-760.
ZHOU Chang-Geng, AN Zhu, LUO Zheng-Ming. Measurement and Correction of K-Shell Ionization Cross Sections for Copper and Gallium by Electron Impact[J]. Chin. Phys. Lett., 2001, 18(6): 759-760.
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