Structural and Electronic Properties of RuSi, RuGe and OsSi
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Abstract
Structural and electronic properties of RuSi, RuGe and OsSi are investigated by first-principles density-functional calculations based on ultrasoft pseudopotential and generalized gradient approximations for the exchange-correlation functional. The bulk moduli for RuGe and OsSi which have not been available from experiments are predicted to be 2.08 and 2.65 Mbar. Though all these compounds with a B20 structure are semiconductors according to the calculation, their band gaps are overestimated compared to those from experiments by a factor of about two.
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HE Guo-Min, LI Shu-Ping, HUANG Mei-Chun. Structural and Electronic Properties of RuSi, RuGe and OsSi[J]. Chin. Phys. Lett., 2001, 18(10): 1389-1391.
HE Guo-Min, LI Shu-Ping, HUANG Mei-Chun. Structural and Electronic Properties of RuSi, RuGe and OsSi[J]. Chin. Phys. Lett., 2001, 18(10): 1389-1391.
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HE Guo-Min, LI Shu-Ping, HUANG Mei-Chun. Structural and Electronic Properties of RuSi, RuGe and OsSi[J]. Chin. Phys. Lett., 2001, 18(10): 1389-1391.
HE Guo-Min, LI Shu-Ping, HUANG Mei-Chun. Structural and Electronic Properties of RuSi, RuGe and OsSi[J]. Chin. Phys. Lett., 2001, 18(10): 1389-1391.
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