Oscillatory Phase Behaviour as a Function of Film Thicknessdue to Confinement in fcc (100) A3B Alloy Thin Films
-
Abstract
The order-disorder phase transitions in fcc thin films are investigated by using the mean field method. The result shows that there is significant difference in the phase transitions and surface segregation between the films of even-number and odd-number layers. There are various types of phase transitions involving several ordered phases with spatial variation for the film of even-number layers, while there is only one phase transition for the film of odd-number layers.
Article Text
-
-
-
About This Article
Cite this article:
NI Jun, LIU Hua, GU Bing-Lin. Oscillatory Phase Behaviour as a Function of Film Thicknessdue to Confinement in fcc (100) A3B Alloy Thin Films[J]. Chin. Phys. Lett., 2001, 18(11): 1504-1506.
NI Jun, LIU Hua, GU Bing-Lin. Oscillatory Phase Behaviour as a Function of Film Thicknessdue to Confinement in fcc (100) A3B Alloy Thin Films[J]. Chin. Phys. Lett., 2001, 18(11): 1504-1506.
|
NI Jun, LIU Hua, GU Bing-Lin. Oscillatory Phase Behaviour as a Function of Film Thicknessdue to Confinement in fcc (100) A3B Alloy Thin Films[J]. Chin. Phys. Lett., 2001, 18(11): 1504-1506.
NI Jun, LIU Hua, GU Bing-Lin. Oscillatory Phase Behaviour as a Function of Film Thicknessdue to Confinement in fcc (100) A3B Alloy Thin Films[J]. Chin. Phys. Lett., 2001, 18(11): 1504-1506.
|