Fabrication of Nanoparticle Pattern Through Atomic ForceMicroscopy Tip-Induced Deposition on Modified Silicon Surfaces

With an atomic force microscopy (AFM) tip used as a “nib”and gold colloidal particles as “ink”, patterns of gold colloidal particles have been deposited successfully from AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane, i.e. (3-mercaptopropyl)-triethoxysilane. This was used as an adhesion agent and can immobilize the nanoparticles delivered from AFM tip onto the substrate surface.