Characteristics of Photoelectron Decay of Silver Halide Microcrystal Illuminated by a Short Pulse Laser
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Abstract
A YAG supershort pulse laser (355nm, 35ps) is used as an exposure source and the microwave dielectric spectrum technique is used to quickly detect the photoelectron decay process in AgX microcrystals, because the free photoelectron lifetime and decay process can decide the sensitivity and other efficiency of silver halide material. The result shows that the free photoelectron average lifetimes of Kodak-100 and Fuji-100 colour film samples are 8.5 and 9.5 ns, respectively.
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YANG Shao-Peng, LI Xiao-Wei, HAN Li, FU Guang-Sheng. Characteristics of Photoelectron Decay of Silver Halide Microcrystal Illuminated by a Short Pulse Laser[J]. Chin. Phys. Lett., 2002, 19(3): 429-431.
YANG Shao-Peng, LI Xiao-Wei, HAN Li, FU Guang-Sheng. Characteristics of Photoelectron Decay of Silver Halide Microcrystal Illuminated by a Short Pulse Laser[J]. Chin. Phys. Lett., 2002, 19(3): 429-431.
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YANG Shao-Peng, LI Xiao-Wei, HAN Li, FU Guang-Sheng. Characteristics of Photoelectron Decay of Silver Halide Microcrystal Illuminated by a Short Pulse Laser[J]. Chin. Phys. Lett., 2002, 19(3): 429-431.
YANG Shao-Peng, LI Xiao-Wei, HAN Li, FU Guang-Sheng. Characteristics of Photoelectron Decay of Silver Halide Microcrystal Illuminated by a Short Pulse Laser[J]. Chin. Phys. Lett., 2002, 19(3): 429-431.
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