Effect of Frequency on Emission of XeI* Excimer in a Pulsed Dielectric Barrier Discharge
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Abstract
Emission spectra of XeI* excimers and ultraviolet intensity at 253 nm from a dielectric barrier discharge (DBD) lamp excited by a pulsed voltage were measured as functions of pressure, electrical power, and frequency. In the DBD lamp driven by a higher frequency voltage, a more intense emission of XeI* excimers with high efficiency at 253 nm was found. A diffuse discharge mode was observed at high xenon pressure (> 1 atm) with an excessive iodine concentration in the DBD driven by a high frequency (60 kHz) voltage.
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OU Qiong-Rong, MENG Yue-Dong, XU Xu, SHU Xing-Sheng, REN Zhao-Xing. Effect of Frequency on Emission of XeI* Excimer in a Pulsed Dielectric Barrier Discharge[J]. Chin. Phys. Lett., 2004, 21(7): 1317-1319.
OU Qiong-Rong, MENG Yue-Dong, XU Xu, SHU Xing-Sheng, REN Zhao-Xing. Effect of Frequency on Emission of XeI* Excimer in a Pulsed Dielectric Barrier Discharge[J]. Chin. Phys. Lett., 2004, 21(7): 1317-1319.
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OU Qiong-Rong, MENG Yue-Dong, XU Xu, SHU Xing-Sheng, REN Zhao-Xing. Effect of Frequency on Emission of XeI* Excimer in a Pulsed Dielectric Barrier Discharge[J]. Chin. Phys. Lett., 2004, 21(7): 1317-1319.
OU Qiong-Rong, MENG Yue-Dong, XU Xu, SHU Xing-Sheng, REN Zhao-Xing. Effect of Frequency on Emission of XeI* Excimer in a Pulsed Dielectric Barrier Discharge[J]. Chin. Phys. Lett., 2004, 21(7): 1317-1319.
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