Measurement of the Third-Order Nonlinear Optical Coefficient of ZnO Crystals by Using ICCD-Z-Scan

We present an image-intensified charge-coupled-device (ICCD) version of Z-scan by employing an ICCD detector and fixing the sample at the beam waist, and a measurement of the third-order nonlinear optical coefficient of single crystal zinc oxide (ZnO). The X⁽³⁾ value of -9.1 x 10^-15cm²/W measured is in agreement with the published result. Our Z-scan configuration of placing sample at beam waist and collecting the whole wavefront by an ICCD detector is simple and can be deployed in cryogenic research where the sample cannot be Z-scanned.