Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium

Using the growth rate method, we obtain the single-electron detachment (SED) cross-sections for 5-30 keV C^-+He, and double-electron detachment (DED) cross-sections for 5-15 keV C^--+He. The SED cross-sections first increase with the increasing incident ion energy, and then decrease with further increase of the energy. The DED cross-sections increase with the increasing incident energy in the 5-15 keV region.