Electronic Structure of Si 1-x IVx/Si Superlattices on Si (001)
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Abstract
We have preformed systematical ab initio studies of the structural and electronic properties of short-period Si 1-x IVx/Si/Si (x=0.125, 0.25, 0.5, IV=Ge, Sn) superlattices (SLs) grown along the 001 direction on bulk Si. The present calculations reveal that the Si 0.875 Ge 0.125/Si, Si 0.75 Ge 0.25/Si and
Si 0.875 Ge 0.125/Si are the Γ-point direct bandgap semiconductors. The technological importance lies in the expectation that the direct gap Si 1-x IVx/Si/Si SLs may be used as components in integrated optoelectronic devices, in conjunction with the already well-established and highly advanced silicon technology.
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CHEN Jie, LÜ Tie-Yu, HUANG Mei-Chun. Electronic Structure of Si 1-x IVx/Si Superlattices on Si (001)[J]. Chin. Phys. Lett., 2007, 24(3): 811-813.
CHEN Jie, LÜ Tie-Yu, HUANG Mei-Chun. Electronic Structure of Si 1-x IVx/Si Superlattices on Si (001)[J]. Chin. Phys. Lett., 2007, 24(3): 811-813.
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CHEN Jie, LÜ Tie-Yu, HUANG Mei-Chun. Electronic Structure of Si 1-x IVx/Si Superlattices on Si (001)[J]. Chin. Phys. Lett., 2007, 24(3): 811-813.
CHEN Jie, LÜ Tie-Yu, HUANG Mei-Chun. Electronic Structure of Si 1-x IVx/Si Superlattices on Si (001)[J]. Chin. Phys. Lett., 2007, 24(3): 811-813.
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