Electron Transport Property of CdTe under High Pressure and Moderate Temperature by In-Situ Resistivity Measurement in Diamond Anvil Cell

In situ resistivity measurement has been performed to investigate the electron transport property of powered CdTe under high pressure and moderate temperature in a designed diamond anvil cell. Several abnormal
resistivity changes can be found at room temperature when the pressure
increases from ambient to 33GPa. The abnormal resistivity changes at about 3.8GPa and 10GPa are caused by the structural phase transitions to the rock-salt phase and to the Cmcm phase, respectively. The other abnormal resistivity changes at about 6.5GPa, 15.5GPa, 22.2GPa and about 30GPa never observed before are due to the electronic phase transitions of CdTe. The origin of the abnormal change occurred at about 6.5GPa is discussed. The temperature dependence of the resistivity of CdTe shows its semiconducting behaviour at least before 11.3GPa.