Simplified Model for Analysing Ion/Photoelectron Images

Based on the Onion--Peeling algorithm (OPA) principle, we present a simplified model for analysing photoion and photoelectron images, which allows the analysis of experimental raw images. A three-dimensional distribution of the nascent charged particles, from which the radial and angular distributions are deduced, can be obtained more easily by this model than by the commonly used procedures. The analysis results of Xe photoelectron images by this model are compared with those from the standard Hankel--Abel inversion. The results imply that this model can be used for complicated (many peaks) and `difficult' (low signal-to-noise) images with cylindrical symmetries, and can provide a reliable reconstruction in some cases when the commonly used Hankel Abel transform method fails.