Measurement of N in High Z Substrate Using Non-Rutherford Backscattering
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Abstract
The relative cross sections of Non-Rutherford backscattering of He ions from N atoms at the energy range of 2-5 MeV were measured. Several resonance energies and corresponding resonance widths are tabled. For analysis of N in high Z substrate, the results of both experiment and computer simulation rvere given in this report.
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DING Furong, DU Shekui, DONG Weizhong. Measurement of N in High Z Substrate Using Non-Rutherford Backscattering[J]. Chin. Phys. Lett., 1992, 9(4): 176-179.
DING Furong, DU Shekui, DONG Weizhong. Measurement of N in High Z Substrate Using Non-Rutherford Backscattering[J]. Chin. Phys. Lett., 1992, 9(4): 176-179.
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DING Furong, DU Shekui, DONG Weizhong. Measurement of N in High Z Substrate Using Non-Rutherford Backscattering[J]. Chin. Phys. Lett., 1992, 9(4): 176-179.
DING Furong, DU Shekui, DONG Weizhong. Measurement of N in High Z Substrate Using Non-Rutherford Backscattering[J]. Chin. Phys. Lett., 1992, 9(4): 176-179.
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