Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon
-
Abstract
The focusing properties of fractal zone plates (FZPs) with different structure parameters are studied experimentally. The axial irradiance of FZPs is deduced at n=4. The experimental results are in good agreement with the theoretical prediction. A method to fabricate FZPs with variable structure parameters is mentioned, and the liquid-crystal-on-silicon device is used to implement this experiment. The experimental results indicate that the focal depth of lower order FZPs is larger than that of higher order FZPs.
Article Text
-
-
-
About This Article
Cite this article:
DAI Hai-Tao, WANG Xin, XU Ke-Shu. Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon[J]. Chin. Phys. Lett., 2005, 22(11): 2851-2854.
DAI Hai-Tao, WANG Xin, XU Ke-Shu. Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon[J]. Chin. Phys. Lett., 2005, 22(11): 2851-2854.
|
DAI Hai-Tao, WANG Xin, XU Ke-Shu. Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon[J]. Chin. Phys. Lett., 2005, 22(11): 2851-2854.
DAI Hai-Tao, WANG Xin, XU Ke-Shu. Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon[J]. Chin. Phys. Lett., 2005, 22(11): 2851-2854.
|