Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films
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Abstract
Fractal crystallization in Au/a-Ge bilayer films was studied by in-situ plane-view and cross-section transmission electron microscopy. The experimental evidences suggest that the fractal crystallization is controlled by both diffusion and reaction processes. The growth kinetics analysis indicates that both diffusion-limited aggregation and random successive nucleation mechanisms play an important role in fractal crystallization in Au/a-Ge bilayer films.
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ZHANG Shu-Yuan, PAN Deng-Yu, WU Zi-Qin. Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films[J]. Chin. Phys. Lett., 2002, 19(6): 828-831.
ZHANG Shu-Yuan, PAN Deng-Yu, WU Zi-Qin. Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films[J]. Chin. Phys. Lett., 2002, 19(6): 828-831.
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ZHANG Shu-Yuan, PAN Deng-Yu, WU Zi-Qin. Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films[J]. Chin. Phys. Lett., 2002, 19(6): 828-831.
ZHANG Shu-Yuan, PAN Deng-Yu, WU Zi-Qin. Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films[J]. Chin. Phys. Lett., 2002, 19(6): 828-831.
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