Probe-Hole Field Emission Microscope System Controlled by Computer
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Abstract
A probe-hole field emission microscope system, controlled by an Apple II computer, has been developed and operated successfully for measuring the work function of a single crystal plane. The work functions on the clean W(100) and W(111) planes are measured to be 4.67eV and 4.45eV, respectively.
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Cite this article:
GONG Yunming, ZENG Haishan. Probe-Hole Field Emission Microscope System Controlled by Computer[J]. Chin. Phys. Lett., 1991, 8(9): 446-449.
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GONG Yunming, ZENG Haishan. Probe-Hole Field Emission Microscope System Controlled by Computer[J]. Chin. Phys. Lett., 1991, 8(9): 446-449.
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GONG Yunming, ZENG Haishan. Probe-Hole Field Emission Microscope System Controlled by Computer[J]. Chin. Phys. Lett., 1991, 8(9): 446-449.
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GONG Yunming, ZENG Haishan. Probe-Hole Field Emission Microscope System Controlled by Computer[J]. Chin. Phys. Lett., 1991, 8(9): 446-449.
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