Crystallization of Ternary Amorphous Ni-Y-AI Films Observed by Scanning Tunneling Microscopy
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Abstract
Ternary thin Ni90-xYxAl10 films have been prepared by using cocondensation method under ultrahigh vacuum condition. Films with a wide concentration range between Ni80Y10Al10 and Ni20Y70AI10 were found to be amorphous. With an addition of 10at.% AI the thermal stability of binary amorphous NiY has been enhanced. This is caused by a more closely packed structure and the bondings between AI and Ni, Y may also play an important role. The surface investigation by scanning tunneling microscopy suggests that the atom redistribution and the crystallization have been limited in the clusters with a size of about 10.5nm. The nanosized amorphous clusters of Ni80Y10Al10 film have changed to nanosized crystalline with the same size of about 12.3nm when crystallization occurred.
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WANG De-liang, U. Geyer, S. Schneider. Crystallization of Ternary Amorphous Ni-Y-AI Films Observed by Scanning Tunneling Microscopy[J]. Chin. Phys. Lett., 1998, 15(12): 901-903.
WANG De-liang, U. Geyer, S. Schneider. Crystallization of Ternary Amorphous Ni-Y-AI Films Observed by Scanning Tunneling Microscopy[J]. Chin. Phys. Lett., 1998, 15(12): 901-903.
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WANG De-liang, U. Geyer, S. Schneider. Crystallization of Ternary Amorphous Ni-Y-AI Films Observed by Scanning Tunneling Microscopy[J]. Chin. Phys. Lett., 1998, 15(12): 901-903.
WANG De-liang, U. Geyer, S. Schneider. Crystallization of Ternary Amorphous Ni-Y-AI Films Observed by Scanning Tunneling Microscopy[J]. Chin. Phys. Lett., 1998, 15(12): 901-903.
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