Room-Temperature Processed Amorphous ZnRhCuO Thin Films with p-Type Transistor and Gas-Sensor Behaviors
-
Abstract
We examine an amorphous oxide semiconductor (AOS) of ZnRhCuO. The a-ZnRhCuO films are deposited at room temperature, having a high amorphous quality with smooth surface, uniform thickness and evenly distributed elements, as well as a high visible transmittance above 87% with a wide bandgap of 3.12 eV. Using a-ZnRhCuO films as active layers, thin-film transistors (TFTs) and gas sensors are fabricated. The TFT behaviors demonstrate the p-type nature of a-ZnRhCuO channel, with an on-to-off current ratio of \sim1\times 10^3 and field-effect mobility of 0.079 cm^2V^-1s^-1. The behaviors of gas sensors also prove that the a-ZnRhCuO films are of p-type conductivity. Our achievements relating to p-type a-ZnRhCuO films at room temperature with TFT devices may pave the way to practical applications of AOSs in transparent flexible electronics.
Article Text
-
-
-
About This Article
Cite this article:
Bojing Lu, Rumin Liu, Siqin Li, Rongkai Lu, Lingxiang Chen, Zhizhen Ye, Jianguo Lu. Room-Temperature Processed Amorphous ZnRhCuO Thin Films with p-Type Transistor and Gas-Sensor Behaviors[J]. Chin. Phys. Lett., 2020, 37(9): 098501. DOI: 10.1088/0256-307X/37/9/098501
Bojing Lu, Rumin Liu, Siqin Li, Rongkai Lu, Lingxiang Chen, Zhizhen Ye, Jianguo Lu. Room-Temperature Processed Amorphous ZnRhCuO Thin Films with p-Type Transistor and Gas-Sensor Behaviors[J]. Chin. Phys. Lett., 2020, 37(9): 098501. DOI: 10.1088/0256-307X/37/9/098501
|
Bojing Lu, Rumin Liu, Siqin Li, Rongkai Lu, Lingxiang Chen, Zhizhen Ye, Jianguo Lu. Room-Temperature Processed Amorphous ZnRhCuO Thin Films with p-Type Transistor and Gas-Sensor Behaviors[J]. Chin. Phys. Lett., 2020, 37(9): 098501. DOI: 10.1088/0256-307X/37/9/098501
Bojing Lu, Rumin Liu, Siqin Li, Rongkai Lu, Lingxiang Chen, Zhizhen Ye, Jianguo Lu. Room-Temperature Processed Amorphous ZnRhCuO Thin Films with p-Type Transistor and Gas-Sensor Behaviors[J]. Chin. Phys. Lett., 2020, 37(9): 098501. DOI: 10.1088/0256-307X/37/9/098501
|