The Effect of By-pass Current on the Accuracy of Resistivity Measurement in a Diamond Anvil Cell

We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell. Due to the by-pass current, the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for a high-resistivity sample. For the consideration of high accuracy of resistivity measurement, a method is presented that the inside wall of the sample chamber should be covered by a polymethylmethane layer. With this highly insulating layer, the by-pass current is effectively prevented and the current density distribution inside the sample is very close to the ideal case.