Beam Manipulation by Metallic Nanoslit Arrays with Perpendicular Cuts inside Slits

Beam manipulation by metallic nanoslit arrays with perpendicular cuts inside the slits was investigated numerically. The simulated results performed by the finite element method (FEM) show that perpendicular cuts with different heights can modulate phase retardation of the transmitted light through the slits. With the proper distribution of cut height, a focused beam is achieved in our metallic nanostructure with four-time amplitude at the focus point and half focal length compared to a slit array without cuts inside. By using asymmetric distribution of height amplitude, a beam deflection around 6° can also be realized in our design.