Photoresponse Properties of an n-ZnS/p-Si Heterojunction
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Abstract
An n-ZnS/p-Si heterojunction was fabricated by using the rf magnetron sputtering method. The band gap of the ZnS film is about 3.63 eV. Current-voltage (I–V) characteristics of the ZnS/Si heterojunction are examined and the results show the distinct rectifying characteristics with a turn-on voltage of about 1.8 V. The UV (330 nm) and visible (450 nm) photoresponse properties of the heterojunction are also investigated, which demonstrates the potential of such an n-ZnS/p-Si heterojunction for detecting both UV and visible light.
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HUANG Jian, WANG Lin-Jun, TANG Ke, XU Run, ZHANG Ji-Jun, LU Xiong-Gang, XIA Yi-Ben. Photoresponse Properties of an n-ZnS/p-Si Heterojunction[J]. Chin. Phys. Lett., 2011, 28(12): 127301. DOI: 10.1088/0256-307X/28/12/127301
HUANG Jian, WANG Lin-Jun, TANG Ke, XU Run, ZHANG Ji-Jun, LU Xiong-Gang, XIA Yi-Ben. Photoresponse Properties of an n-ZnS/p-Si Heterojunction[J]. Chin. Phys. Lett., 2011, 28(12): 127301. DOI: 10.1088/0256-307X/28/12/127301
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HUANG Jian, WANG Lin-Jun, TANG Ke, XU Run, ZHANG Ji-Jun, LU Xiong-Gang, XIA Yi-Ben. Photoresponse Properties of an n-ZnS/p-Si Heterojunction[J]. Chin. Phys. Lett., 2011, 28(12): 127301. DOI: 10.1088/0256-307X/28/12/127301
HUANG Jian, WANG Lin-Jun, TANG Ke, XU Run, ZHANG Ji-Jun, LU Xiong-Gang, XIA Yi-Ben. Photoresponse Properties of an n-ZnS/p-Si Heterojunction[J]. Chin. Phys. Lett., 2011, 28(12): 127301. DOI: 10.1088/0256-307X/28/12/127301
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