High Performance Polymer Field-Effect Transistors Based on Thermally Crosslinked Poly(3-hexylthiophene)
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Abstract
The performance of polymer field-effect transistors is improved by thermal crosslinking of poly(3-hexylthiophene), using ditert butyl peroxide as the crosslinker. The device performance depends on the crosslinker concentration significantly. We obtain an optimal on/off ratio of 105 and the saturate field−effect mobility of 0.34 cm2V−1s−1, by using a suitable ratios of ditert butyl peroxide, 0.5 wt% of poly(3-hexylthiophene). The microstructure images show that the crosslinked poly(3-hexylthiophene) active layers simultaneously possess appropriate crystallinity and smooth morphology. Moreover, crosslinking of poly(3-hexylthiophene) prevents the transistors from large threshold voltage shifts under ambient bias-stressing, showing an advantage in encouraging device environmental and operating stability.
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JIANG Chun-Xia, YANG Xiao-Yan, ZHAO Kai, WU Xiao-Ming, YANG Li-Ying, CHENG Xiao-Man, WEI Jun, YIN Shou-Gen. High Performance Polymer Field-Effect Transistors Based on Thermally Crosslinked Poly(3-hexylthiophene)[J]. Chin. Phys. Lett., 2011, 28(11): 118502. DOI: 10.1088/0256-307X/28/11/118502
JIANG Chun-Xia, YANG Xiao-Yan, ZHAO Kai, WU Xiao-Ming, YANG Li-Ying, CHENG Xiao-Man, WEI Jun, YIN Shou-Gen. High Performance Polymer Field-Effect Transistors Based on Thermally Crosslinked Poly(3-hexylthiophene)[J]. Chin. Phys. Lett., 2011, 28(11): 118502. DOI: 10.1088/0256-307X/28/11/118502
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JIANG Chun-Xia, YANG Xiao-Yan, ZHAO Kai, WU Xiao-Ming, YANG Li-Ying, CHENG Xiao-Man, WEI Jun, YIN Shou-Gen. High Performance Polymer Field-Effect Transistors Based on Thermally Crosslinked Poly(3-hexylthiophene)[J]. Chin. Phys. Lett., 2011, 28(11): 118502. DOI: 10.1088/0256-307X/28/11/118502
JIANG Chun-Xia, YANG Xiao-Yan, ZHAO Kai, WU Xiao-Ming, YANG Li-Ying, CHENG Xiao-Man, WEI Jun, YIN Shou-Gen. High Performance Polymer Field-Effect Transistors Based on Thermally Crosslinked Poly(3-hexylthiophene)[J]. Chin. Phys. Lett., 2011, 28(11): 118502. DOI: 10.1088/0256-307X/28/11/118502
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