Investigation of C₆₀ Single Crystal by X-Ray Methods

C₆₀ single crystals grown by a single-temperature-gradient technique were characterized by synchrotron radiation white beam x-ray topography and x-ray double crystal diffraction with Cu K_α1 radiation on conventional x-ray source. The results show that the crystal is rather well crystallized. The x-ray topographies give an evidence of dendritic growth mechanism of C₆₀ single crystal, and x-ray double crystal diffraction rocking curve shows that there are mosaic structural defects in the sample. A phase transition at 249 ± 1.5K from a simple cubic to a face centered cubic structure is confirmed by in situ observation of synchrotron radiation white beam x-ray topography with the temperature varing from 230 to 295K.