Microdefects in Te-Rich PbTe Bulk Crystal
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Abstract
The microdefects in Te-rich PbTe coating material grown by Bridgman technique have been studied via transmission electron microscopy. The results indicate that the major microdefects in Te-rich PbTe crystal are plate-like defects lying on 100 plane and homogeneously distributed in the matrix with density about 1.7x1016/cm3. They are originated from the precipitation of native point defects in Te-rich PbTe which occured in the cooling and annealing process and presented in the form of plates consisting of Te anti-site atoms or interstitial Te atoms.
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