Detection of Plasma Produced in the Interaction Between YAG Laser and CCD
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Abstract
A Q-switched YAG laser is used to act repeatedly upon a charge-coupled devices (CCD) having metal-oxide-semiconductor structure, and plasmas in the process are investigated by a Mach-Zehnder interferomcter. According to the production and development of the plasmas, the damage mechanism of the optoelectronic device is analyzed.
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