X-RAY DIFFRACTION OF Cu/Ti FIBONACCI SUPERLATTICES
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Abstract
1-D quasiperiodic (Fibonacci) Cu/Ti metallic superlattices have been prepared in a dual magnetron sputter deposition system. X-ray scattering measurements of these samples are presented. The X-ray diffraction peaks at low angles can be indexed by the projection method from the high-dimensional periodic structure. In the high angle region, there is one broad peak, which indicates that the samples are amorphous.
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