Double Electron Processes in Collisions of Partially Stripped Ions Cq+(q=1-4) with Helium
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DING Bao-Wei,
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CHEN Xi-Meng,
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YU De-Yang,
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FU Hong-Bin,
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LIU Zhao-Yuan,
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SUN Guang-Zhi,
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LIU Yu-Wen,
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LU Yan-Xia,
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XIE Jiang-Shan,
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DU Juan,
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GAO Zhi-Min,
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CHEN Lin,
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CUI Ying,
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SHAO Jian-Xiong,
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HE Zi-Feng,
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CAI Xiao-Hong
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Abstract
The multi-electron processes are investigated for 17.9--120keV/u C1+, 30--323keV/u C2+, 120--438keV/u C3+, 287--480keV/u C4+ incident on a helium target. The cross-section ratios of double electron (DE) process to the total of the single electron (SE) and the double electron process (i.e. SE+DE), the direct double electron (DDI) to the direct single ionization (DSI) as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed.
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