DEPTH PROFILES OF BROMINE IN 79Br+ ION IMPLANTED Pb1-xSnxTe OBTAINED BY SIMS MEASUREMENT AND THEORETICAL CALCULATION
-
Abstract
The depth profile of Br in 79Br+ ion implanted lead-tin-telluride, Pb1-xSnxTe, was obtained by secondary ion mass spectrometry(SIMS). The SIMS profile has been compared with that obtained by our theoretical calculation, in which a more realistic interatomic potential and reasonable electronic stopping power were used. The SIMS result agrees well with the theoretical calculation.
Article Text
-
-
-
About This Article
Cite this article:
XIA Yueyuan(Y.Y.HSIA), TAN Chunyu, WANG Yihua, HU Xierong, XU qianwei. DEPTH PROFILES OF BROMINE IN 79Br+ ION IMPLANTED Pb1-xSnxTe OBTAINED BY SIMS MEASUREMENT AND THEORETICAL CALCULATION[J]. Chin. Phys. Lett., 1986, 3(8): 337-340.
|
XIA Yueyuan(Y.Y.HSIA), TAN Chunyu, WANG Yihua, HU Xierong, XU qianwei. DEPTH PROFILES OF BROMINE IN 79Br+ ION IMPLANTED Pb1-xSnxTe OBTAINED BY SIMS MEASUREMENT AND THEORETICAL CALCULATION[J]. Chin. Phys. Lett., 1986, 3(8): 337-340.
|
XIA Yueyuan(Y.Y.HSIA), TAN Chunyu, WANG Yihua, HU Xierong, XU qianwei. DEPTH PROFILES OF BROMINE IN 79Br+ ION IMPLANTED Pb1-xSnxTe OBTAINED BY SIMS MEASUREMENT AND THEORETICAL CALCULATION[J]. Chin. Phys. Lett., 1986, 3(8): 337-340.
|
XIA Yueyuan(Y.Y.HSIA), TAN Chunyu, WANG Yihua, HU Xierong, XU qianwei. DEPTH PROFILES OF BROMINE IN 79Br+ ION IMPLANTED Pb1-xSnxTe OBTAINED BY SIMS MEASUREMENT AND THEORETICAL CALCULATION[J]. Chin. Phys. Lett., 1986, 3(8): 337-340.
|
DownLoad: