DEPTH PROFILES OF BROMINE IN ⁷⁹Br⁺ ION IMPLANTED Pb_1-xSn_xTe OBTAINED BY SIMS MEASUREMENT AND THEORETICAL CALCULATION

The depth profile of Br in ⁷⁹Br⁺ ion implanted lead-tin-telluride, Pb_1-xSn_xTe, was obtained by secondary ion mass spectrometry(SIMS). The SIMS profile has been compared with that obtained by our theoretical calculation, in which a more realistic interatomic potential and reasonable electronic stopping power were used. The SIMS result agrees well with the theoretical calculation.