THE INSTENSITY RATIOS I(L)/I(K) FROM Ge TO Sn MEASURED IN TEM USING EDS

The intensity ratios I(L)/I(K) from Ge to Sn have been measured in a Transmission electron microscope (TEM) using X-ray energy dispersive spectroscopy (EDS) at 40, 80, 100, 120, 160, 200kV. The large discrepancy between experimental and calculated values indicates that the formula of ionization cross-section should be revised.