Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium
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Abstract
Using the growth rate method, we obtain the single-electron detachment (SED) cross-sections for 5-30 keV C-+He, and double-electron detachment (DED) cross-sections for 5-15 keV C--+He. The SED cross-sections first increase with the increasing incident ion energy, and then decrease with further increase of the energy. The DED cross-sections increase with the increasing incident energy in the 5-15 keV region.
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