Effective Medium Model for Refractive Indices of Thin Films with Oblique Columnar Structure
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Abstract
The refractive indices of thin films, containing dielectric and voids in an oblique columnar structure, are modelled in the quasi-static limit. The dielectric function is shown to be strongly dependent on the angle of incidence and on the columnar orientation for p-polarized light. This model is applied to model ZnS thin films with oblique columnar structures and the computed results have been given.
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